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Texas Instruments |
| Part No. |
SNJ54BCT8373AJT
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| Description |
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
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| Tech specs |
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Official Product Page
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Texas Instruments |
| Part No. |
SNJ54BCT8374AJT
|
| Description |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
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| Tech specs |
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|
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Official Product Page
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|
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Texas Instruments |
| Part No. |
SNJ54BCT8245AFK
|
| Description |
Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125
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| Tech specs |
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|
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Official Product Page
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|
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Texas Instruments |
| Part No. |
SN74BCT8240ADW
|
| Description |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
|
| Tech specs |
|
|
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Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SN74BCT8245ADW
|
| Description |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SNJ54BCT8374AFK
|
| Description |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SNJ54BCT8244AJT
|
| Description |
Scan Test Devices With Octal Buffers 24-CDIP -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SNJ54BCT8373AFK
|
| Description |
Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SNJ54BCT8244AFK
|
| Description |
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
 |
Texas Instruments |
| Part No. |
SNJ54BCT8240AFK
|
| Description |
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
|

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Price and Availability
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