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Texas Instruments |
| Part No. |
SNJ54BCT8373AJT
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| Description |
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
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| Tech specs |
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Official Product Page
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Texas Instruments |
| Part No. |
SNJ54BCT8374AJT
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| Description |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125
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| Tech specs |
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Official Product Page
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Texas Instruments |
| Part No. |
SNJ54BCT8245AFK
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| Description |
Scan Test Devices With Octal Bus Transceivers 28-LCCC -55 to 125
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| Tech specs |
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Official Product Page
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Texas Instruments |
| Part No. |
SN74BCT8240ADW
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| Description |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Inverting Buffers 24-SOIC 0 to 70
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| Tech specs |
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Official Product Page
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Molex Electronics Ltd.
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| Part No. |
22-28-0052
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| Description |
2.54mm (.100) Pitch KK庐 Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, 0.76渭m (30渭) Gold (Au) Selective Plating
2.54mm (.100) Pitch KK? Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, 0.76μm (30μ) Gold (Au) Selective Plating
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| File Size |
167.41K /
6 Page |
 View
it Online |
Download Datasheet
|
| |
|
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Texas Instruments |
| Part No. |
SN74BCT8245ADW
|
| Description |
IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Bus Transceivers 24-SOIC 0 to 70
|
| Tech specs |
|
|
|
Official Product Page
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Molex Electronics Ltd.
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| Part No. |
22-28-0051
|
| Description |
2.54mm (.100) Pitch KK庐 Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, 0.38渭m (15渭) Gold (Au) Selective Plating
2.54mm (.100) Pitch KK? Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, 0.38μm (15μ) Gold (Au) Selective Plating
|
| File Size |
55.50K /
5 Page |
View
it Online |
Download Datasheet |
| |
|
|
Texas Instruments |
| Part No. |
SNJ54BCT8374AFK
|
| Description |
Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
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| |
|
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Molex Electronics Ltd.
|
| Part No. |
22-28-0050
|
| Description |
2.54mm (.100) Pitch KK庐 Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, Tin (Sn) Plating
2.54mm (.100) Pitch KK? Header, Breakaway, Vertical, with Friction Lock, 5 Circuits, Tin (Sn) Plating
|
| File Size |
167.49K /
6 Page |
View
it Online |
Download Datasheet |
| |
|
|
Texas Instruments |
| Part No. |
SNJ54BCT8244AJT
|
| Description |
Scan Test Devices With Octal Buffers 24-CDIP -55 to 125
|
| Tech specs |
|
|
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Official Product Page
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| |
|
|
Texas Instruments |
| Part No. |
SNJ54BCT8373AFK
|
| Description |
Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
|
Texas Instruments |
| Part No. |
SNJ54BCT8244AFK
|
| Description |
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
|
| |
|
|
Texas Instruments |
| Part No. |
SNJ54BCT8240AFK
|
| Description |
Scan Test Devices With Octal Buffers 28-LCCC -55 to 125
|
| Tech specs |
|
|
|
Official Product Page
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Bom2Buy.com
Price and Availability
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