| PART |
Description |
Maker |
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| UPD72107CW UPD72107L UPD72107GC-3B9 |
LAP-B CONTROLLER(Link Access Procedure Balanced mode) B控制器（链路访问过程平衡模式
1 CHANNEL(S), 4M bps, SERIAL COMM CONTROLLER, PQFP80
|
NEC Corp.
NEC, Corp.
|
| 44281-0001 44281-0002 44281-0003 44281-0004 44281- |
Mini-Fit Test Plugs
Mini-Fit垄芒 Test Plugs
|
Molex Electronics Ltd.
|
| A701 |
A701: Test slide, various cancers plus corresponding normal
A701: Test slide various cancers plus corresponding normal
A701: Test slide, various cancers plus corresponding normal
|
List of Unclassifed Manufacturers
Electronic Theatre Controls, Inc.
ETC[ETC]
|
| HCTS393MS HCTS393KMSR HCTS393K HCTS393HMSR HCTS393 |
Radiation Hardened Dual 4-Input NOR Gate
Test Bus Controllers 68-CPGA -55 to 125
Test Bus Controllers 68-CFP -55 to 125
Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered
Radiation Hardened Dual 4-Stage Binary Counter
From old datasheet system
|
INTERSIL[Intersil Corporation]
|
| 5951A |
Test Probe Set; Connector Type A:Replaceable-Tip Probe (1 Black/1 Red); Connector Type B:Right-Angle Banana Plug; Cable Length:4ft; Current Rating:5A; Features:2 Stainless Steel Sharp Replaceable Probe Tips RoHS Compliant: NA INTERCONNECTION DEVICE
Test Probe Set Replaceable Tip
|
Pomona Electronics
|
| BCM1510TRP BCM1500TRP |
CALISTO™ Test and Reference Platform
CALISTO TEST AND REFERENCE PLATFORM
|
BOARDCOM[Broadcom Corporation.]
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| MB6052USZ-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
