| PART |
Description |
Maker |
| QTS-016-01-L-D-DP-A |
High Speed Characterization
|
Samtec
|
| AN-24 |
A Simplified Test Set for Op Amp Characterization
|
Electronic Theatre Controls, Inc.
|
| AN3012 |
Electrical Characterization of MAAMSS0031 CATV Amplifier at 5 Volts and Reduced Gain
|
M/A-COM Technology Solutions, Inc.
|
| EFM32TG210F8-QFN32 EFM32TG825F16-BGA48 EFM32TG108F |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
| KRC410E |
SEMICONDUCTOR
|
KEC(Korea Electronics)
|
| BA6664FM |
Semiconductor IC
|
Rohm CO.,LTD.
|
| KIA34063AF |
SEMICONDUCTOR
|
KEC(Korea Electronics)
|
| KRC422E |
SEMICONDUCTOR
|
KEC(Korea Electronics)
|
| 68HC908JB8FS |
Freescale Semiconductor, Inc.
|
MOTOROLA[Motorola, Inc]
|
| SIB765170 |
AC Semiconductor Contactor
|
celduc-relais
|
| SIL865170 |
AC Semiconductor Contactor
|
celduc-relais
|
| B1500A |
Semiconductor Device Analyzer
|
Agilent(Hewlett-Packard)
|
