| PART |
Description |
Maker |
| TLP311307 TLP3113 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3215 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3122 |
Logic Testers / Memory Testers
|
Toshiba Semiconductor
|
| CAT28F010 CAT28F010TI-70T CAT28F010PI-70T CAT28F01 |
120ns 2M-bit CMOS flash memory
90ns 2M-bit CMOS flash memory
70ns 2M-bit CMOS flash memory
1 Megabit CMOS Flash Memory
High Speed CMOS Logic 8-Stage Shift-and-Store Bus Register with 3-Stage Outputs 16-PDIP -55 to 125
|
http://
CATALYST[Catalyst Semiconductor]
|
| TLP354207 |
TESTERS DATA RECORDING EQUIPMENTS
|
Toshiba Corporation
Toshiba Semiconductor
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
