| PART |
Description |
Maker |
| TLP209D-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3131 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3216 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3250 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
| 1691A 1693AD 1680A 1680AD |
1690A PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State 136 Channels 1M Memory
1693AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State 34 Channels 4M Memory
1690AD PC-Hosted Logic Analyzer with 800 MHz Timing/200 MHz State 136 Channels 4M Memory
1680AD Standalone Logic Analyzer with 800 MHz Timing/200 MHz State 136 Channels 4M Memory
|
Agilent (Hewlett-Packard)
|
| TLP354207 |
TESTERS DATA RECORDING EQUIPMENTS
|
Toshiba Corporation
Toshiba Semiconductor
|
| 07010 19240 19250 |
Calibration Unit for Testers Installation, Operation and Maintenance
|
List of Unclassifed Manufacturers
|
| XC17S50APDG8C XC17S50ASO20C |
XC2S50 PROM C grade 559200 X 1 CONFIGURATION MEMORY, PDIP8
SERIAL PROM FOR 50000 SYSTEM GATE LOGIC 559200 X 1 CONFIGURATION MEMORY, PDSO20
|
Xilinx, Inc.
|
| 010-0133 |
BNC TESTER (ELECTRICAL)
|
List of Unclassifed Manufac...
|
| A-1865-06311-UNILAPISO5KV |
INSULATION TESTER 5KV 5kV的绝缘测试仪
|
Bourns, Inc.
|
| 88E1322 |
Advanced Virtual Cable Tester? (VCTTM)
|
Maxwell Technologies
|
