| PART |
Description |
Maker |
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3115 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP209D-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3131 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3123 |
Photocoupler PHOTORELAY
Measurement Instruments Power Line Control
|
Toshiba Semiconductor
|
| F2224-11M F2224-11P F2224-11S F2224-14 F2224-14M F |
Circular MCP and assembly series. For analytical instruments, electron tibe, cosmic measurement, high energy physics
|
Hamamatsu Corporation
|
| AD53508 |
Dual Channel Parametric Measurement Circuit With Five Current Measurement Ranges And Output Voltage Range Of -4V to 9V
|
Analog Devices
|
| KK74HC04A KK74HC04AD KK74HC04AN |
Replacement for Texas Instruments part number 54AC112413A. Buy from authorized manufacturer Rochester Electronics. 六角逆变高性能硅栅CMOS
Hex Inverter High-Performance Silicon-Gate CMOS 六角逆变高性能硅栅CMOS
Replacement for Texas Instruments part number 54AC11241LA. Buy from authorized manufacturer Rochester Electronics. 六角逆变高性能硅栅CMOS
|
KODENSHI, CORP.
KODENSHI KOREA CORP.
|
| MC6405 |
P-Channel 30-V (D-S) MOSFET Battery Powered Instruments
|
ShenZhen FreesCale Electronics. Co., Ltd
|
| JQX-102FAZ20BDC12C0.9 JQX-102FAZ20BDC24C0.9 JQX-10 |
Used in household appliances like air conditioning , heater and instruments etc
|
DB Lectro Inc
|
| GA3220 |
Programmable Signal Processing Platform for Hearing Instruments
|
Gennum Corporation
|
