| |
|
 |
SGS Thomson Microelectronics
|
| Part No. |
AN565
|
| OCR Text |
...he 12th Annual IEEE Reliability physics Symposium April 1974
March 2001
1/16
AN565 - APPLICATION NOTE Specifically, the test matrix used is as in table 1. Table 1: Test Condition Matrix TEST T1 T2 T3 T4 T5 T6 T7 T8 T9 DEVICE MSC-1... |
| Description |
MEDIAN-TIME-TO-FAILURE (MTF) OF A L-BAND POWER TRANSISTOR UNDER RF CONDITIONS
|
| File Size |
160.57K /
16 Page |
 View
it Online |
Download Datasheet
|
| |
|
|
SGS Thomson Microelectronics
|
| Part No. |
AN473
|
| OCR Text |
...d others are not related to the physics of the device but are simply fit parameters to model the device as close as possible to reality. This paper shows a different way to tackle the problem which employs a new powerful package, COSMOS, en... |
| Description |
A NEW APPROACH TO PARAMETER EXTRACTION FOR THE SPICE POWER MOSFET MODEL
|
| File Size |
42.97K /
7 Page |
View
it Online |
Download Datasheet |
|
Price and Availability
|
