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FAIRCHILD[Fairchild Semiconductor]
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| Part No. |
SCANPSC110FSC SCANPSC110F SCANPSC110FSCX
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| OCR Text |
...t bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modu... |
| Description |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE 1149.1 Support) SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) From old datasheet system
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| File Size |
267.57K /
25 Page |
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